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stuck-at-0 fault

См. также в других словарях:

  • Fault coverage — refers to the percentage of some type of fault that can be detected during the test of an electronic system, usually an integrated circuit. High fault coverage is particularly valuable during manufacturing test, and techniques such as Design For… …   Wikipedia

  • Fault friction — describes the relation of friction to fault mechanics. Rock failure and associated earthquakes are very much a fractal operation (see Characteristic earthquakes). The process remains scale invariant down to the smallest crystal. Thus, the… …   Wikipedia

  • Fault model — A fault model is an engineering model of something that could go wrong in the construction or operation of a piece of equipment. From the model, the designer or user can then predict the consequences of this particular fault. Fault models can be… …   Wikipedia

  • Stuck-at fault — A Stuck at fault is a particular fault model used by fault simulators and Automatic test pattern generation (ATPG) tools to mimic a manufacturing defect within an integrated circuit. Individual signals and pins are assumed to be stuck at Logical… …   Wikipedia

  • Single Stuck Line — is a fault model used in digital circuits. It is used for post manufacturing testing, not design testing. The model assumes one line or node in the digital circuit is stuck at logic high or logic low. When a line is stuck it is called a fault.… …   Wikipedia

  • Semiconductor fault diagnostics — are predictive software algorithms which are used to refine and localize the circuitry responsible for the failure of scan based devices. [cite conference| last=Crowell| first=G| coauthors=Press, R.| title=Using Scan Based Techniques for Fault… …   Wikipedia

  • SSL — can refer to:In computing and electronics: * Secure Sockets Layer, a communications protocol, predecessor to Transport Layer Security * Server Side Language, a category of programming languages used on the web which execute on the server * S/SL… …   Wikipedia

  • Automatic test pattern generation — ATPG (acronym for both Automatic Test Pattern Generation and Automatic Test Pattern Generator) is an electronic design automation method/technology used to find an input (or test) sequence that, when applied to a digital circuit, enables testers… …   Wikipedia

  • 2009–2011 Toyota vehicle recalls — Two of the vehicles under recall: the Toyota Camry (top) and the Toyota Corolla Three separate but related recalls of automobiles by Toy …   Wikipedia

  • Defective pixel — Close up of an LCD, showing a dead green subpixel Defective pixels are pixels on a liquid crystal display (LCD) not performing as expected. The ISO standard ISO 13406 2 distinguishes between three different types of defective pixels,[1][2] while… …   Wikipedia

  • Spirit rover — (MER A) Artist s concept of Rover on Mars Operator NASA Mission type Rover Launch date …   Wikipedia

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